Application Scenario

During the production of photovoltaic (PV) panels, processes such as etching, cleaning, and coating can lead to defects like microcracks, scratches, and uneven diffusion. By applying a forward bias or using infrared illumination, SWIR cameras can perform Electroluminescence (EL) or Photoluminescence (PL) inspections on PV panels. This method detects internal defects like microcracks and uneven diffusion, ensuring the power generation efficiency and operational stability of the final product, thereby providing a reliable guarantee of product quality.

I-TEK Solution: TPL Series SWIR Camera

Inspection Results

Image from Monochrome Camera

Image from SWIR Camera